Products and services for AFM, STM, and SEM
Scanning Probe Microscopy for Materials Analysis.
Exotic curiosity or practical tool?
Litigation Support and Expert Testimony
Calibration and Measurement Software
Used Nanoscope Equipment
Repair your NanoScope AFM.
Large stock of repair parts.
Special Sale Items
Applications of AFM and STM
Naturally occurring (cellulose)
Cast, extruded, or molded polymers
CorrosionNew materials including ultra high strength magnets
Optics & Photonics
FAQ: Questions, Answers, Advice and Opinion
These scanners are for the NanoScope small sample AFM and STM, respectively. In the small AFM, the sample mounts on the scanner (a magnet holds the steel disk) In the small STM, the tip mounts on the scanner.
In the NanoScope AFM, automatic approach is provided using a stepper motor in the AFM base. This motor turns one of the three adjustment screws in the scanner.
- The TGT01 specimen from NT-MDT is an array of spikes
- A well-characterized stamper can be useful, when analyzed with DiscTrack Plus.
- The 300-2D specimen is an array of posts and may be useful.
The calibration of my NanoScope AFM changed. Can I adjust the Z scale of a previously-captured NanoScope image so that the measurements are correct?
Yes. First, make a backup copy of your image files. Then, use the following procedure (given for version 4.23 software- other versions are similar): Start Z, go to offline, open the image file you want to change, go to Modify Ė Parameter. The Parameter command allows the Z range and Scan size of a captured image to be rescaled based on new sensitivity information. For example, suppose you found that the original height measurements were too low by 5%. Record the Z range value displayed in the dialog box. Multiply it by 1.05 and enter the result in Z range. When the image is re-displayed, you will measure the corrected height.
These calibration specimens are fabricated using a silicon wafer substrate which is overcoated with a polymer material. A precision, laser-generated, interference pattern is recorded in this material and then overcoated with about 50 nm of tungsten. This provides a reasonably durable coating and an electrically conductive path to ground. The (-1D) specimen pattern consists of ridges and the (-2D) specimen pattern consists of posts.
We sell several additional calibraiton specimens. Please see the Calibrator Guide.
We have found experimentally that they cannot be used in STM. It appears that the STM tip must penetrate the oxide layer on the W in order to achieve tunneling. The extreme pressure created by the tip breaks through the W coating and tunneling becomes unstable.
It may be possible to overcoat the specimen with a noble metal to achieve more stable tunneling and we would be happy to learn of customer success in that area.
Is it possible to buy the grating only (without software)?
--The physical size is 4 x 3 x 0.5 mm. The entire area is covered with the pattern.
We provide basic and advanced spm training, customized to meet the customerís needs. The emphasis is on hands on operation with discussion of general skills as well as techniques that are specific to your samples. We can come to your site to work with you on your equipment or you can come to our laboratory.
Yes. None of ASM's software uses dates for any calculation. However, for added security, ASM's software has been tested in a Year 2000 environment and assured to work just as it does pre-2000.
The traceable calibration standard is a select grade of material that is individually measured and certified. The quality is higher, with fewer defects than would be found on the ordinary calibration specimen. Each piece is individually measured against a transfer standard previously measured by a national laboratory, which has certified that the measurement value is traceable to the international meter.
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