ASM LOGO

Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

CD stamper bumps, perspective view

 

CONTACT US:
Phone:  1-800-374-8557  Fax: 1-317-895-5652
e-mail: info@asmicro.com

Search this site.

Contents

Home
: Products and services for AFM, STM, and SEM
: Applications of AFM and STM
   : CD
   : DVD
   : HD-DVD
   :Blu-Ray
   : Hard Disks
   : Magnetic Tape
   : More
: Pharmaceutical materials
     : Collagen fibers
     : Collagen monomers
     : DNA Plasmids
   : Polymer molecules
   : Orthopedic implants
   : Opthamalic Devices
   : Diagnostic devices
   : And More
   : Powders
   : Naturally occurring (cellulose)
   : Blends
   : Copolymers
   :Homopolymers
   : Material domains
   : Paper
   : Packaging materials
   : Cast, extruded, or molded polymers
: Coatings
   : Paint
   : Paper finishing
   : Can coatings
: Electronic Materials
   : Silicon
   : Silicon Carbide
   : Germanium
   : Gallium Arsenide
   : Wafers
   : Thin Films
: Automotive
   : Corrosion
   : Wear
: Energy Technologies
   : Corrosion
   : Calalysts
: New materials including ultra high strength magnets
: Optics & Photonics
   : Diffraction Gratings
   : Modified surfaces
   : superpolished optics
   : Ultrasmooth surfaces
   : IR
   : Visible Light
   : UV
   : X-Ray
: Telecommunications

: Metals

:Gallery of interesting images

:Links

 

Publications and Patents - Don Chernoff


updated 7/22/13 - this is intended to be a complete list.

LIST OF SCIENTIFIC PUBLICATIONS by DONALD ALAN CHERNOFF

1. "Coenzyme B12 Model Studies. Equilibria and Kinetics of Axial Ligation of Methylaquocobaloxime by Primary Amines and 4-substituted Pyridines," Kenneth L. Brown, Donald Chernoff, David J. Keljo and Roland G. Kallen, J. Am. Chem. Soc. 94, 6697-6704 (1972)

2. "Laser Cavity", Donald A. Chernoff, Program # 366, Quantum Chemistry Program Exchange, Indiana University (1978). (non-refereed)

3. "Single Vibronic Level Fluorescence from Aniline," Donald A. Chernoff and Stuart A. Rice, J. Chem. Phys. 70, 2511-2520 (1979).

4. "Collision Induced Intramolecular Vibrational Energy Transfer in 1B2 Aniline," Donald A. Chernoff and Stuart A. Rice, J. Chem. Phys. 70, 2521-2541 (1979).

5. "Comment on 'Fluorescence from an Upper Singlet of Aromatic C-Nitroso Compounds'", Donald A. Chernoff and Robin M. Hochstrasser, Chem. Phys. Letts. 70, 213-214 (1980).

6. "Chemistry of Exciplexes. 9. Viscosity Effect on Intramolecular Exciplex Formation in Saturated Hydrocarbons", N.C. Yang, Soon Bin Neoh, Takeaki Naito, Lay-Keow Ng, Donald A. Chernoff, and Daniel B. McDonald, J. Am. Chem. Soc. 102, 2806-2810 (1980).

7. "Geminate Recombination of O2 and Hemoglobin", D.A. Chernoff, R.M. Hochstrasser and A.W. Steele, Proc. Natl. Acad. Sci. (U.S.A.) 77, 5606-5610 (1980).

8. "Absorption Spectra of HbO2 and Hb After Picosecond Photolysis: Evidence for Subnanosecond Geminate Recombination", D.A. Chernoff, R.M. Hochstrasser, and A. W. Steele, in Hemoglobin and Oxygen Binding, ed. by Chien Ho (Elsevier, 1982).

9. "Intramolecular Vibrational Energy Transfer in 1B2 Aniline Induced by Collisions with H2O and CH3F," Mark Vandersall, Donald A. Chernoff and Stuart A. Rice, J. Chem. Phys. 74, 4888-4892 (1981).

10. "The Observation of a Picosecond Transient in the Relaxation of an Iron Porphyrin," P.A. Cornelius, A.W. Steele, D.A. Chernoff, and R.M. Hochstrasser, Chem. Phys. Letts. 82, 9-14 (1981).

11. "Different Dissociation Pathways and the Observation of an excited Deoxy State in the Picosecond Photolysis of Oxy- and Carboxy-myoglobin," P.A. Cornelius, A.W. Steele, D.A. Chernoff, and R.M. Hochstrasser, Proc. Natl. Acad. Sci. (U.S.A.), 78, 7526-7529 (1981).

12. "Picosecond Transient Raman Spectroscopy: The Photoisomerization of trans-Stilbene," T.L. Gustafson, D.M. Roberts and D.A. Chernoff, J. Chem. Phys. 79, 1559-1564 (1983).

13. "Picosecond Transient Raman Spectrum Measured", D.A. Chernoff, T.L. Gustafson and D.M. Roberts, Laser Focus/Electro-optics, Oct.,1983, p.38.
(non-refereed)

14. "The Structure of Electronic Excited States in trans-Stilbene: Picosecond Transient Stokes and Anti-Stokes Raman Spectra", T.L. Gustafson, D.M. Roberts, and D. A. Chernoff, J. Chem. Phys. 81, 3438-3443 (1984).

15. "Picosecond Transient Raman Spectroscopy: the Excited State Structure of Diphenylpolyenes", T.L. Gustafson, D.A. Chernoff, J.F. Palmer, D.M. Roberts, in Ultrafast Phenomena, ed. by Auston and Eisenthal, Springer-Verlag, (Berlin: 1984), pp. 266-269.

16. "Applications of Picosecond Transient Raman Spectroscopy", T.L. Gustafson, D.A. Chernoff, J.F. Palmer, and D.M. Roberts, Proc. SPIE 533, 78-86 (1985).

17. "Picosecond Transient Raman Spectroscopy Using the High Repetition Rate, Amplified, Synchronously Pumped Dye Laser", T.L. Gustafson, D.A. Chernoff, J.F. Palmer, and D.M. Roberts, in: Time Resolved Vibrational Spectroscopy II, ed. by A. Laubereau and M. Stockburger, Springer-Verlag (Berlin: 1985).

18. "The Structure of Electronic Excited States: Ultraviolet Excited Raman Spectroscopy and Picosecond Transient Raman spectroscopy", T.L. Gustafson, D.A. Chernoff, J.F. Palmer, and D.M. Roberts, in: Proc. U.S./Japan Seminar on Time Resolved Raman Spectrsocopy, G.H. Atkinson and S. Maeda, Eds., (Gordon and Breach, New York, 1986).

19. "Long-lived, High Energy Vibrational Levels in Benzene Vapor", D.A. Chernoff, J.D. Myers, and J.G. Pruett, J. Chem. Phys. 85, 3732-3734 (1986).

20. "Cathodoluminescence in Aluminum Nitride", R.A. Youngman and D.A. Chernoff, Ceramic Bulletin 66, 1233 (1987). (reprint of a prize-winning poster presented at the American Ceramic Society annual meeting).

21. "Principles of Scanning Tunneling Microscopy and Selected Applications at BP America (Standard Oil)", D.A. Chernoff, Abstracts of Papers presented at the 1988 Pittsburgh Conference and Exposition on Analytical Chemistry and Applied Spectroscopy, Abstract #169 (1988).

22. "Cathodoluminescence and Photoluminescence in Aluminum Nitride", R.A. Youngman, J.H. Harris, and D.A. Chernoff, Ceramic Transactions 5, 399 (1989).

23. "Atomic Force Microscope Imaging for Process Characterization in Diamond Film Deposition", Donald A. Chernoff and Henry Windischmann, J. Vac. Sci. Technol. A 10., 2126 (1992).

24. "Atomic Force Microscope Images of Collagen Fibers", Ellen A.G. Chernoff and Donald A. Chernoff, J. Vac. Sci. Technol. A 10, 596 (1992).

25. Scanning Force Microscopy; with Applications to Electric, Magnetic, and Atomic Forces. by Dror Sarid. Book review by Donald A. Chernoff, J. Solid State Chem. 98, 5371 (1992).

26. "Atomic Force Microscopy: A Practical Tool for Problem Solving", Don Chernoff, Microscopy Today, Nov. 1992, p.6-7.

27. "Atomic Force Microscopy: Exotic Invention or Practical Tool?", Donald A. Chernoff, Proc. 51st Ann. Mtg. of the Microscopy Society of America, p. 526, 1993.

28. "Contact and non-contact Atomic Force Microscopy of Type I Collagen", Ellen A.G. Chernoff, Donald A. Chernoff, and Kevin Kjoller, Proc. 51st Ann. Mtg. of the Microscopy Society of America, p. 518, 1993.

29. "Atomic Force Microscope (AFM) analysis of photoresist test structures for use in SEM as in-house linewidth standards", Donald A. Chernoff, SPIE 1995 International Symposium on Microlithography, Technical Conference 2439: Integrated Circuit Metrology, Inspection, and Process Control IX. pp. 392-400.

30. "High Resolution Chemical Mapping Using Tapping Mode AFM with Phase Contrast", Donald A. Chernoff, Proceedings Microscopy and Microanalysis, G.W. Bailey et al., eds., Jones & Begell Publishing, New York, USA, 1995, pp. 888-889.

31. "High Precision Calibration of a Scanning Probe Microscope (SPM) for Manufacturing Applications", Donald A. Chernoff, Jason D. Lohr, Douglas Hansen and Michael Lines, Scanning 18, p. 159 (1996).

33. "High Precision Calibration of a Scanning Probe Microscope (SPM) for Pitch and Overlay Measurements", Donald A. Chernoff, Jason D. Lohr, Douglas Hansen and Michael Lines, SPIE 1997 International Symposium on Microlithography, Technical Conference 3050: Metrology, Inspection, and Process Control for Microlithography XI, pp.243-249.

34. "High Accuracy Track Pitch Measurement on DVDs using a Scanning Probe Microscope", Donald A. Chernoff, presented in Workshop on DVD Process Optimization, Replitech International, June 1997.

35. "A new methodology for detecting track pitch errors", Donald A. Chernoff and David L. Burkhead, One to One magazine, December 1997, p. 67-71.

36. "Automated, high precision Measurements of Track Pitch and Pit Geometry using the Atomic Force Microscope", Donald A. Chernoff and David L. Burkhead, presented in Workshop on Measurement and Testing. Replitech North America, June 1998.

37. "Automated, high precision measurement of critical dimensions using the Atomic Force Microscope", Donald A. Chernoff and David L. Burkhead, J. Vac. Sci. Technol. A 17, 1457 (1999).

38. "Automated, High Precision Measurement of Critical Dimensions using the Scanning Probe Microscope", Donald A. Chernoff and David L. Burkhead, SPIE 1999 International Symposium on Microlithography, Technical Conference 3677: Metrology, Inspection, and Process Control for Microlithography XIII, pp786-795.

39. "Atomic Force Microscopy", Donald A. Chernoff and Sergei Magonov, chapter 19 in "Comprehensive Desk Reference of Polymer Characterization and Analysis", R. Brady, ed., Oxford University Press, New York. 2003

40. "Automated analysis of data mark microstructure of various media in the Optical Disc industry", Candi S. Cook, Donald A. Chernoff and David L. Burkhead, in Optical Data Storage 2000, Douglas G. Stinson, Ryuichi Katayama, Editors, Proceedings of SPIE vol. 4090, pp. 16-25 (2000).

41. "AFM Length Analysis of Data Marks: Measuring Jitter, Asymmetry, Process Noise and Process Position", Donald A. Chernoff and David L. Burkhead, in Optical Data Storage 2001, Terril Hurst, Seiji Kobayashi, Editors, Proceedings of SPIE vol. 4342, pp. 515-523 (2002).

42. "The use of AFM to investigate the delignification process: Part I - AFM performance by differentiating pulping processes", Pereira , D.E.D., Chernoff, D., Claudio-da-Silva, Jr. E., & Demuner, B. J., ATIP magazine, vol 56 number 2, april -Mai 2001. (ATIP is Associassion Technique de la Industrie Papeterie).

43. "AFM Analysis of Wobble Amplitude", David. L. Burkhead and Donald A. Chernoff, ODS/ISOM 2002 conference, Hawaii July 7-11, 2002. (extended abstract).

44. "Analysis of Composite Surfaces with the Atomic Force Microscope: A Problem-Solving Approach", Donald A. Chernoff, in Surface Modification Technologies XV, ed. by T.S. Sudarshan and M. Jeandin, ASM International, 2002, pp.79-86.

45. ?Picometer-scale accuracy in pitch metrology by optical diffraction and atomic force microscopy?, Donald A. Chernoff, Egbert Buhr, David L. Burkhead, and Alexander Diener, in ?Metrology, Inspection, and Process Control for Advanced Lithography XXII?, edited by John Allgair, Proceedings of SPIE Vol. 6922, 2008. http://spiedigitallibrary.org/ -- Proc. SPIE 6922, 69223J (2008)

46. ?Roadmap for Traceable Calibration of a 5-nm Pitch Length Standard?, Donald A. Chernoff and David L. Burkhead, Proc. SPIE 7638, 763837 (2010).

47. ?Resurrecting dirty atomic force microscopy calibration standards?, Donald A. Chernoff and Robert Sherman, J. Vac. Sci. Technol. B 28, pp. 643-647 (May 2010). Permalink: http://dx.doi.org/10.1116/1.3388847

48. ?Interlaboratory Comparison of Traceable Atomic Force Microscope Pitch Measurements?, Ronald Dixson, Donald A. Chernoff, Shihua Wang, Joseph Fu, Ndubuisi Orji, Theodore Vorburger, Siew Leng Tan, SPIE Scanning Microscopy May 2010. SPIE Proceedings: 7729-14.

49. ?Multilaboratory comparison of traceable atomic force microscope measurements of a 70 nm grating pitch standard?, Ronald Dixson, Donald A. Chernoff, Shihua Wang, Theodore V. Vorburger, Siew Leng Tan, Ndubuisi Orji, Joseph Fu, J. Micro/Nanolith. MEMS MOEMS 10, 013015 (Mar 08, 2011); doi:10.1117/1.3549914 
Online Publication Date: Mar 08, 2011

50. ?Traceable Pitch Metrology: Supporting the Development of Patterned Media and More?, Donald A. Chernoff and David L. Burkhead, J. Micro/Nanolith. MEMS MOEMS 11, 011008 (Mar. 29, 2012); DOI: 10.1117/1.JMM.11.1.011008 [published online Mar. 29, 2012]

PATENTS

1. "High precision calibration and feature measurement system for a scanning probe microscope", Donald A. Chernoff and Jason D. Lohr, U.S. Patent # 5,644,512, issued July 1, 1997.

2. "High precision calibration and feature measurement system for a scanning probe microscope", Donald A. Chernoff and Jason D. Lohr, U.S. Patent # 5,825,670, issued October 20, 1998.

TECHNICAL STANDARDS DOCUMENTS

1. ASTM E 2382-04 "Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy", under jurisdiction of ASTM Committee E42 on Surface Analysis and direct responsibility of Subcommittee E42.14 on STM/AFM. Published by ASTM International. September 2004. www.astm.org.
ASTM does not give authorship credit, however the major contributors to this document included: Don Chernoff, Greg Meyers, John Villarrubia and Yale Strausser.

 

Trademark and Copyright Notice

 

Hit Counter