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Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

CD stamper bumps, perspective view

 

CONTACT US:
Phone:  1-800-374-8557  Fax: 1-317-895-5652
e-mail: info@asmicro.com

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Contents

Home
: Products and services for AFM, STM, and SEM
: Applications of AFM and STM
   : CD
   : DVD
   : HD-DVD
   :Blu-Ray
   : Hard Disks
   : Magnetic Tape
   : More
: Pharmaceutical materials
     : Collagen fibers
     : Collagen monomers
     : DNA Plasmids
   : Polymer molecules
   : Orthopedic implants
   : Opthamalic Devices
   : Diagnostic devices
   : And More
   : Powders
   : Naturally occurring (cellulose)
   : Blends
   : Copolymers
   :Homopolymers
   : Material domains
   : Paper
   : Packaging materials
   : Cast, extruded, or molded polymers
: Coatings
   : Paint
   : Paper finishing
   : Can coatings
: Electronic Materials
   : Silicon
   : Silicon Carbide
   : Germanium
   : Gallium Arsenide
   : Wafers
   : Thin Films
: Automotive
   : Corrosion
   : Wear
: Energy Technologies
   : Corrosion
   : Calalysts
: New materials including ultra high strength magnets
: Optics & Photonics
   : Diffraction Gratings
   : Modified surfaces
   : superpolished optics
   : Ultrasmooth surfaces
   : IR
   : Visible Light
   : UV
   : X-Ray
: Telecommunications

: Metals

:Gallery of interesting images

:Links

 

President Donald A. Chernoff, PhD

Dr. Donald A. Chernoff, President

Biography

Don Chernoff was educated at the University of Chicago (B.S. Chemistry 1973, Ph.D. Physical Chemistry 1978). He has more than 30 years of industrial research and engineering experience, including 8 years at Standard Oil (Ohio), now BP, and 2 years at Boehringer Mannheim, now Roche Diagnostics. In 1990, he founded Advanced Surface Microscopy, Inc., an independent analytical research and testing laboratory.

Experience with AFM and NanoParticles.

View Don Chernoff's LinkedIn profile View Don Chernoff's profile


 

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