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Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

CD stamper bumps, perspective view

 

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Phone:  1-800-374-8557  Fax: 1-317-895-5652
e-mail: info@asmicro.com

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Digital Instruments/Veeco Metrology
 Dimension 3000 Atomic Force Microscope system 


This system includes:

  • Dimension 3000 AFM

  • NanoScope Control Station with NanoScope IIIA controller and PC 

  • vibration isolation table with optional simple hood to shield AFM from drafts (moving air)

NanoScope Dimension 3000 base with Fiber Optic Illuminator light source.
Dimension 3000 AFM on TMC VT102 vibration isolation table 
Detail of Scanner on NanoScope Dimension 3000 Microscope
Dimension 3000 AFM close-up view, showing the sample chuck and scanner.  A magnetic sheet (for holding Nickel stampers) is on top of the standard vacuum chuck.

NanoScope Dimension 3000 Control Station

NanoScope IIIA Control Station for D3000

NanoScope Dimension 3000 base with protective metal hood.
AFM in simple hood
Protective Metal Hood for a NanoScope Dimension 3000 Microscope on a VT102 Vibration Isolation Table.

Simple Hood on VT102 table

Another view of the protective metal hood.

Simple hood front and side openings give convenient access

 

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