Products and services for AFM, STM, and SEM
Scanning Probe Microscopy for Materials Analysis.
Exotic curiosity or practical tool?
Litigation Support and Expert Testimony
Calibration and Measurement Software
Used Nanoscope Equipment
Repair your NanoScope AFM.
Large stock of repair parts.
Special Sale Items
Applications of AFM and STM
Naturally occurring (cellulose)
Cast, extruded, or molded polymers
CorrosionNew materials including ultra high strength magnets
Optics & Photonics
Advanced Surface Microscopy announces new products and services
at the American Vacuum Society National
Meeting in Philadelphia. See us at booth 938, Tuesday
Oct. 15 - Thursday Oct. 17.
#1) Advanced Surface Microscopy is showing with MOXTEK
the SPM CalibratorTM, a new standard for image
accuracy in scanning probe microscopy. SPM CalibratorTM
correct image distortion and improves the accuracy of critical
dimension measurements 5- to 10-fold. It also simplifies routine
QC tests of SPM performance.
Advanced Surface Microscopy is also showing its DiscTrackTM
system. DiscTrackTM provides a complete solution
to the problem of measuring track pitch for DVD (Digital Versatile
Disc), the new high density compact disc format. It is also useful
for feature measurement on magnetic disks.
Related technical presentations:
#2) Advanced Surface Microscopy is showing applications of phase imaging
a new technique in Scanning Probe Microscopy. Phase imaging provides
new information about composite surfaces, showing the spatial
location of the component materials, with lateral resolution down
to 10 nm. This impacts industries including electronics, health
care, and food packaging. Advanced Surface Microscopy has been
a leader in scanning probe microscopy analytical services and
research since 1990.
HIGH PRECISION CALIBRATION OF A SCANNING PROBE MICROSCOPE (SPM) FOR MANUFACTURING APPLICATIONS
Donald A. Chernoffa, Jason D. Lohra, Douglas Hansenb, and Michael Linesb
aAdvanced Surface Microscopy, Inc., Indianapolis, IN
bMOXTEK, Inc., Orem, UT
A general purpose SPM can function as a metrology SPM when used with a new type of calibration standard and new software. We illustrate this process by measuring the nominal 740-nm track pitch on high density compact discs (DVD).
We used a 288-nm pitch, 1-dimensional holographic grating (MOXTEK) as the calibration reference. It consists of a Silicon substrate with a patterned photoresist, overcoated with a tungsten thin film. The holographic exposure process assures uniform feature spacing over the entire specimen area, with an expected accuracy of 0.1%. We operated a NanoScope III/Dimension 3000 large sample SPM in contact mode. To gather sufficient data for statistical analysis, we captured 15-micron wide images of the reference and unknown (compact disc) specimens. We analyzed average cross-section profiles using ASM's Calibrator Pro(TM) software, which reports feature locations with subpixel precision and reveals subtle image distortions. We corrected the nonlinear SPM length scale using additional software. Whereas the raw pitch values for the reference standard had std.dev. = 4.4 nm, corrected pitch values had sd = 1.1 nm. One compact disc had sd= 27 nm and failed the DVD specification. A second disc had sd= 6.8 nm and passed.
We have demonstrated a new methodology for calibrating SPM images. The key innovations include: the use of a highly uniform, sub-micron pitch standard; the calculation of feature positions with sub-pixel precision; and replacement of the nonlinear raw length scale with a corrected, linear length scale. We have applied this method to a manufacturing problem requiring careful metrology.
D.A. Chernoff and J.D. Lohr, Advanced Surface Microscopy,
Inc., 6009 Knyghton Rd., Indianapolis, IN 46220.
Composite surfaces of industrial interest may be created either deliberately (microfabrication of thin film recording heads, polymer processing) or accidentally (contaminants and defects). Tapping Mode/Phase images can map the material domains with spatial resolution down to 10 nm. Such images can be a powerful aid in process control.
Phase images show the mechanical phase of the tapping tip relative to the drive signal which oscillates the cantilever. The phase image supplements the ordinary height image and often provides unique contrast related to material differences in stiffness and adhesion.
We present several examples for both inorganic and organic systems, including:
- detection of photoresist residue on silicon
- identification of contaminant/wear particles on a magnetic recording head
- growth of corrosion films
- domains on a copolymer surface
- thin coatings of lignin on cellulose
- mixed Langmuir-Blodgett films
By scanning the same spot with different probes and operating
modes, we showed that phase contrast correlated well with friction
contrast in LFM. We discuss correlations with adhesion images.
We compare phase images captured under ordinary low force conditions
in air ("soft tapping") with those captured during "hard
tapping" in air (as described by S. Magonov) and soft tapping
Trademark and Copyright Notice