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Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

CD stamper bumps, perspective view

 

CONTACT US:
Phone:  1-800-374-8557  Fax: 1-317-895-5652
e-mail: info@asmicro.com

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Contents

Home
: Products and services for AFM, STM, and SEM
: Applications of AFM and STM
   : CD
   : DVD
   : HD-DVD
   :Blu-Ray
   : Hard Disks
   : Magnetic Tape
   : More
: Pharmaceutical materials
     : Collagen fibers
     : Collagen monomers
     : DNA Plasmids
   : Polymer molecules
   : Orthopedic implants
   : Opthamalic Devices
   : Diagnostic devices
   : And More
   : Powders
   : Naturally occurring (cellulose)
   : Blends
   : Copolymers
   :Homopolymers
   : Material domains
   : Paper
   : Packaging materials
   : Cast, extruded, or molded polymers
: Coatings
   : Paint
   : Paper finishing
   : Can coatings
: Electronic Materials
   : Silicon
   : Silicon Carbide
   : Germanium
   : Gallium Arsenide
   : Wafers
   : Thin Films
: Automotive
   : Corrosion
   : Wear
: Energy Technologies
   : Corrosion
   : Calalysts
: New materials including ultra high strength magnets
: Optics & Photonics
   : Diffraction Gratings
   : Modified surfaces
   : superpolished optics
   : Ultrasmooth surfaces
   : IR
   : Visible Light
   : UV
   : X-Ray
: Telecommunications

: Metals

:Gallery of interesting images

:Links

 

ASM news and announcements


  • New Service:  Repair of Z drift in large sample microscopes.
  • ASM Launches re-designed website November 26, 2014.
  • Don Chernoff presented a poster at Diskcon, Sept. 17-18, 2008 (and also gave a related talk in the Innovation Zone).  
    "Picometer-scale Accuracy in Position Measurements of NanoDots in a 525 Gdot/in2 Pattern", [3.2 MB pdf file]
    ASM also exhibited DiscTrack Plus(TM) software and used Atomic Force Microscopes.
  • Don Chernoff presented a poster at SPIE Advanced Lithography Feb. 25, 2008.  Picometer-scale accuracy in pitch metrology by optical diffraction and atomic force microscopy
  • ASM exhibits at Materials Research Society, Boston Mass.  Nov29-Dec1, 2005. 
    Advanced Surface Microscopy Inc. is exhibiting products and services related to Atomic Force/Scanning Probe Microscopy.  We provide analytical services, nanometer-scale calibration specimens, probe tips, high accuracy measurement software, and training.  We buy, refurbish, sell and install NanoScope/Veeco/Digital Instruments AFMs.  
    See us at booth 824, shared with Applied NanoFluorescence.
  • 6/13/00-6/15/00 - Replitech North America in Miami, Florida
  • 5/14/00 - Don Chernoff will be presenting a poster on automated measurement of feature geometry in various optical disc media at the Optical Data Storage convention in British Columbia, Canada
  • 2/22/00-2/24/00 - Advanced Surface Microscopy, making their first appearance at RepliTech Europe in Dusseldorf Germany, release DiscTrack Plus version 3.4
  • 6/08/99-6/10/00 - Advanced Surface Microscopy, making their first appearance at RepliTech North America, release DiscTrack Plus version 3.2
  • 1/15/99 DiscTrack Plus, version 3.0 is released
  • 10/18/98 - Don Chernoff will discuss automation improvements in SPM in a presentation at the Nov. '98 AVS meeting and at the Oct., 1998 MOMS seminar
  • 10/18/98 -Second Patent issued to ASM for measurement techniques
  •  1/19/98 - Historical note about Pittcon symposium on Scanning Tunnelling Microscopy in Feb 1988.
  •  2/6/97 - ASM announces availability of DiscTrack version 2.4 and Calibrator Pro 2.3.

Winner:  1997 Di Calendar 10/23/96 - An ASM image is chosen for the 1997 Digital Instruments calendar.

 

 

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