Products and services for AFM, STM, and SEM
Scanning Probe Microscopy for Materials Analysis.
Exotic curiosity or practical tool?
Litigation Support and Expert Testimony
Calibration and Measurement Software
Used Nanoscope Equipment
Repair your NanoScope AFM.
Large stock of repair parts.
Special Sale Items
Applications of AFM and STM
Naturally occurring (cellulose)
Cast, extruded, or molded polymers
CorrosionNew materials including ultra high strength magnets
Optics & Photonics
Track Pitch Variation
MagneTrackTM measures MFM images.
To put more data on a disk, you must decrease track pitch. But when the tracks are too close together, cross-talk causes data errors. In an ideal disk drive, the servo marks are placed at equal radial intervals and the tracking servo responds perfectly to those marks; the track spacing can be as small as allowed by the magnetic performance of the media and the head. In a real drive, track pitch variation requires an increase (added tolerance) in the target track pitch. Now you can analyze Magnetic Force Microscope (MFM) images to obtain this information directly, with nanometer-scale accuracy, without relying on an indirect calibration.
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