Products and services for AFM, STM, and SEM
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Applications of AFM and STM
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A precision, holographic pattern providing accurate calibration for high resolution, nanometer-scale measurements.
Period: 145 nm pitch, one-dimensional grating. Accurate to +/- 1 nm.
Surface: Aluminum lines on glass, 4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.
For AFM, use in contact, intermittent contact (TappingModeTM ) and other modes with image sizes from 250 nm to 10 mm. Available unmounted or mounted on 12 mm steel disks.
Usability: the calibrated pattern covers the entire chip. There is sufficient usable area to make tens of thousands of measurements without reusing any areas altered or contaminated by previous scans.
This Calibration Reference specimen comes with a non-traceable, manufacturer’s certificate. This states the average period, based on batch measurements.
2.5 um AFM scan
image rendered in mixed height and slope mode
Average height profile from above image
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