Guide to Nanotechnology Calibration Specimens

Tools for NanoTechnology Nanometer Calibration and Test Specimens

new 70-1D/70-1DUTC

150-2D /150-2DUTC

(3x3 um AFM scan)

(4 um AFM scan)

300-1D

NEW 300-2D

301BE/292UTC

700-1D

700-2D

NanoChannel Array with Stopper, 751-HD NEW

We also sell traceable calibration standards
See an example of long-term calibration drift.

Traceable Calibration is now available for the 301BE, 150-2D, and 150-1D specimens, as models 292 UTC, 150-DUTC, and 145 TC. This helps you achieve higher quality and meed ISO-9000 and 14000 requirements.

What does traceability mean?
The calibration certificate for ordinary specimens gives an average pitch value based on batch measurements. In contrast, the certificate of traceable calibration reports the average pitch value and the uncertainty of single pitch values, based on individual measurements of the actual specimen and the measurements are traceable to the international meter. Our traceability path is via PTB, the German counterpart of NIST. This is equivalent to NIST traceability, based on a mutual recognition agreement for nanoscale measurements among NIST, PTB, and other leading national measurement labs.

Application	Product	Pattern	Approx. Pitch* (nm)	Material	Mounting	Remarks
AFM, SEM, Auger, FIB	70-1D and 70-1DUTC	parallel ridges	70	SiO₂ on Si	unmounted, on steel disk or on an SEM stub (extra charge)	Use contact or tapping mode.
AFM, SEM, Auger, STM	150-2D and 150-2DUTC	Array of rounded bumps	144	Al on Si	unmounted, on steel disk, or on an SEM stub (extra charge)	use contact or tapping mode. Works well in SEM SEI and BEI modes
AFM,SEM*, TOF-SIMS, Auger, Surface Potential, other material contrast techniques. NSOM.	150-1D and 145TC	Parallel ridges	144	Al lines on Glass	unmounted or on steel disk	use contact or tapping mode. *may require customer-deposited coating for SEM or Auger use.
AFM,SEM, TOF-SIMS, Auger, Surface Potential, other material contrast techniques.	301BE and 292UTC	parallel ridges	292	Ti lines on Si	unmounted, on steel disk, or on an SEM stub (extra charge)	use contact or tapping mode. Works well in SEM SEI and BEI modes
AFM	300-1D	Parallel ridges	288	W-coated Photoresist on Si	15 mm steel disk	use contact or TappingMode.
AFM	300-2D	Array of Posts	297	Al bumps on Si	15 mm steel disk	use contact or TappingMode
AFM,SEM	302-edu	Array of Posts	292	W-coated Photoresist on Si	unmounted	student grade. has high density of random scratches. use TappingMode
AFM	700-1D	Parallel ridges	700	W-coated Photoresist on Si	15 mm steel disk	use contact or TappingMode
AFM	700-2D	Array of Posts	700	W-coated Photoresist on Si	15 mm steel disk	use TappingMode
AFM,SEM, STM	750-HD	Array of flat bumps	750 (X), Z (100)	Ni	unmounted	High Durability: TappingMode, Contact Mode, STM, Liquid, High Temperature
AFM Phase Imaging	PT	random hard and soft domains as small as 10 nm	none	polymer	15 mm steel disk	test resolution and build confidence in phase imaging
Special Sample Preparation	751-HD NanoChannel Array Substrate	array of ridges with occasional bulges ("stoppers")	n/a. Channel width about 370 nm, depth about 180 nm	Nickel	unmounted, see data sheet for details	Confine materials in channel. Use ridges as NanoAnvil in 3-point bend test. Priced for use as disposable substrate. Not intended as a calibrator.

* A certificate accompanies each specimen giving the actual pitch value.

Specimen compatibility -
AFM and STM Scanning Modes and Special Environments:
Specimen	TappingMode^TM	Contact Mode	STM	Liquid	High Temperature
70-1D, 70-1DUTC	Yes	Yes	No	Not yet tested	Not yet tested
301BE, 292UTC	Yes	Yes	No	Not yet tested	Not yet tested
150-2D, 150-2DUTC, 300-2D.	Yes	Yes	Yes	Not yet tested	Not yet tested
150-1D, 145TC	Yes	Yes	No	Not yet tested	Not yet tested
300-1D, 700-1D	Yes	Yes	No	No	No
700-2D, 302-edu	Yes	No	No	No	No
750-HD	Yes	Yes	Yes	Yes	Yes
751-HD	Yes	Yes	Yes	Yes	Yes
PT	Yes	Yes	No	Yes	No

Specimens can be gold coated by user for STM. Sorry, no warranty or refund after you modify the specimen.

Specimens available unmounted, mounted on steel disks, or mounted on SEM mounts.

What customers say about our Calibration and Test Specimens

"The Model 150-2D calibration specimen arrived promptly and has already helped us identify a problem with one of our AFMs."
- A. J. Katan, University of Leiden, The Netherlands

Prices

Ordering information

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This page last updated 03/19/2010

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