Products and services for AFM, STM, and SEM
Scanning Probe Microscopy for Materials Analysis.
Exotic curiosity or practical tool?
Litigation Support and Expert Testimony
Calibration and Measurement Software
Used Nanoscope Equipment
Repair your NanoScope AFM.
Large stock of repair parts.
Special Sale Items
Applications of AFM and STM
Naturally occurring (cellulose)
Cast, extruded, or molded polymers
CorrosionNew materials including ultra high strength magnets
Optics & Photonics
Training, Consulting, and Expert Services
At Advanced Surface Microscopy, we make our expertise available to you in a variety of ways.
Company Founder and President Donald A. Chernoff has been using Scanning Tunneling, Atomic Force, and other forms of Scanning Probe Microscopes since 1986 and is one of the pioneers in the field. In 1990 he founded Advanced Surface Microscopy and has been specializing in these forms of microscopy ever since.
Senior Analytical Scientist David L. Burkhead first started using Scanning Tunneling and Atomic Force Microscopes in in 1996. On graduation the next year he came to work for Advanced Surface Microscopy where he has been involved in Atomic Force Microscopy ever since.
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