Our Skilled Technical Staff:
All technical work is supervised by Dr. Donald A. Chernoff. Dr. Chernoff holds a Ph.D. in Physical Chemistry (University of Chicago) and has more than 30 years industrial research experience; he has been active in the field of scanning probe microscopy since its development in 1986. His significant contributions in the area of laser spectroscopy and optics, electron microscopy and the practical application of microscopy to process improvement have resulted in over 50 publications and patents.
David Burkhead, has a B.S. in Physics (University of Akron) and has been providing distinguished SPM analysis and software development at ASM since 1997.
Raleigh Tolliver
Jon Goldman