Download our Calibrator Guide PDF.
70-1D/70-1DUTC
Notice: The Model 70-1D is out of stock. A limited number of 70-1DUTC remain.
- Applications: AFM, SEM, Auger, FIB
- Pattern: parallel ridges
- Approximate Pitch1: 70 nm
- Material: SiO2 on Si
- Mounting: Unmounted, On 12 or 15 mm Steel Disk, or on SEM Stub (extra charge)
- Remarks: Use Contact or Tapping mode AFM. Works well in SEM
150-2D /150-2DUTC
- Applications: AFM, SEM, Auger, STM
- Pattern: Array of rounded bumps
- Approximate Pitch1: 144 nm
- Material: Alon Si
- Mounting: Unmounted, on 12 or 15 mm Steel Disk, or on SEM Stub (extra charge)
- Remarks: use contact or tapping mode. Works well in SEM.
150-1D/145TC
- Applications: AFM,SEM2, TOF-SIMS, Auger, Surface Potential, other material contrast techniques. NSOM’s Super Resolution Optical Microscopy
- Pattern: Parallel Ridges
- Approximate Pitch1: 144 nm
- Material: Allines on Glass
- Mounting: Unmounted or on 12 or 15 mm steel disk
- Remarks: use contact or tapping mode..
750-HD
- Applications: AFM,SEM, STM
- Pattern: Array of flat bumps
- Approximate Pitch1: X 750 nm, Z 100 nm
- Material: Ni
- Mounting: Unmounted
- Remarks: High Durability: TappingMode, Contact Mode, STM, Liquid, High Temperature
301BE/292UTC
- Applications: AFM,SEM, TOF-SIMS, Auger, Surface Potential, other material contrast techniques.
- Pattern: Parallel Ridges
- Approximate Pitch1: 292 nm
- Material: Ti lines on Si
- Mounting: unmounted, on steel disk, or on an SEM stub (extra charge)
- Remarks: use contact or tapping mode. Works well in SEM SEI and BEI modes
700-1D/700-1DUTC
Details
- Applications: AFM, SEM
- Pattern: Parallel Ridges
- Approximate Pitch1: 700 nm
- Material: W coated photoresist on Si.
- Mounting: 12 or 15 mm steel disk
- Remarks: use contact or tapping mode.
Sample Dimension and Pattern Orientation.
Traceable Calibration is now available for the 70-1D, 301BE, 150-2D, and 150-1D specimens, as models 70-1DUTC, 292 UTC, 150-DUTC, and 145 TC. This helps you achieve higher quality and meet ISO-9000 and 14000 requirements.
What does traceability mean?
The calibration certificate for ordinary specimens gives an average pitch value based on batch measurements. In contrast, the certificate of traceable calibration reports the average pitch value and the uncertainty of single pitch values, based on individual measurements of the actual specimen and the measurements are traceable to the international meter. Our traceability path for 70-1DUTC is via NIST. Our traceability path for 150-2DUTC, 145TC, 292UTC, and 700-1DUTC is via PTB, the German counterpart of NIST. This is equivalent to NIST traceability, based on a mutual recognition agreement for nanoscale measurements among NIST, PTB, and other leading national measurement labs.
Download our Calibrator Guide PDF.
Calibration Specimen Details
Specimen compatibility - AFM and STM Scanning Modes and Special Environments:
Specimens can be gold coated by user for STM. Sorry, no warranty or refund after you modify the specimen.
Specimens available unmounted, mounted on steel disks, or mounted on SEM mounts.
What customers say about our Calibration and Test Specimens
The Model 150-2D calibration specimen arrived promptly and has already helped us identify a problem with one of our AFMs.”
– A. J. Katan, University of Leiden, The Netherlands
1 A certificate accompanies each specimen giving the actual pitch value.
2 may require customer-deposited coating for SEM or Auger use
3 a conductive coating may be required for STM use.
4 Available unmounted or mounted (extra cost – please specify desired stub).
5. SNOM is Scanning Near-field Optical Microscopy, sometimes called NSOM (near-field scanning optical microscopy).