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Calibration Specimen Details

ApplicationProductPatternApprox.
Pitch1 (nm)
MaterialMountingRemarks
AFM, SEM4, Auger, FIB70-1D (out of stock) and 70-1DUTC parallel ridges70SiO2 on Siunmounted, on steel disk or on an SEM stub (extra charge)Use contact or tapping mode. Works well in SEM
AFM, SEM4, Auger, STM3150-2D and 150-2DUTC Array of rounded bumps 144 Al on Siuse contact or tapping mode. Works well in SEM SEI and BEI modesuse contact or tapping mode. Works well in SEM SEI and BEI modes
AFM,SEM2, TOF-SIMS, Auger2, Surface Potential, other material contrast techniques. NSOM5.150-1D and 145TC
Parallel ridges
144Al lines on Glassunmounted or on steel diskuse contact or tapping mode.
AFM, SEM4, TOF-SIMS, Auger, Surface Potential, other material contrast techniques.301BE and 292UTCparallel ridges292Ti lines on Siunmounted, on steel disk, or on an SEM stub (extra charge)use contact or tapping mode. Works well in SEM SEI and BEI modes
AFM, SEM300-1DParallel ridges288W-coated Photoresist on Si15 mm steel diskuse contact or TappingMode.
AFM, SEM300-2DArray of Posts297Al bumps on Si15 mm steel diskuse contact or TappingMode
AFM, SEM700-1DParallel ridges
700
W-coated Photoresist on Si15 mm steel diskuse contact or TappingMode
AFM, SEM
700-2D
Array of Posts700W-coated Photoresist on Si15 mm steel diskuse TappingMode
AFM, SEM4, STM, Extreme Environments750-HDArray of flat bumps750 (X), Z (100)
Ni

unmounted
High Durability: TappingMode, Contact Mode, STM, Liquid, High Temperature
AFM Phase ImagingPTrandom hard and soft domains as small as 10 nm nonepolymer
15 mm steel disk
test resolution and build confidence in phase imaging
AFM, Nanomechanics, Nanofluidics 751-HD NanoChannel Array Substratearray of ridges with occasional bulges ("stoppers")n/a. Channel width about 370 nm, depth about 180 nm Nickel unmounted, see data sheet for details Confine materials in channel. Use ridges as NanoAnvil in 3-point bend test.
Priced for use as disposable substrate. Not intended as a calibrator.

Specimen compatibility - AFM and STM Scanning Modes and Special Environments:

SpecimenTappingModeTMContact ModeSTMSEM, Auger, and similar techniques4LiquidHigh Temperature
70-1D, 70-1DUTCYesYesNoYesNot yet testedNot yet tested
301BE, 292UTCYesYesNoYesNot yet testedNot yet tested
150-2D, 150-2DUTC,YesYesYesYesNot yet testedNot yet tested
300-2D, 302-eduYesYesYesYesNot yet testedNot yet Tested
150-1D, 145TCYesYesNoYesNot yet testedNot yet tested
300-1D, 700-1DYesYesNoNoNoNo
700-2DYesNoNoNoNoNo
750-HDYesYesYesNoYesYes
751-HDYesYesYesNoYesYes
PTYesYesNoNoYesNo

Specimens can be gold coated by user for STM.  Sorry, no warranty or refund after you modify the specimen.

Specimens available unmounted, mounted on steel disks, or mounted on SEM mounts.

What customers say about our Calibration and Test Specimens

“The Model 150-2D calibration specimen arrived promptly and has already helped us identify a problem with one of our AFMs.” 
    – A. J. Katan, University of Leiden, The Netherlands


1 A certificate accompanies each specimen giving the actual pitch value. 

2 may require customer-deposited coating for SEM or Auger use

3 a conductive coating may be required for STM use.

4 Available unmounted or mounted (extra cost – please specify desired stub).

5. SNOM is Scanning Near-field Optical Microscopy, sometimes called NSOM (near-field scanning optical microscopy).