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Calibration Specimen Details
Application | Product | Pattern | Approx. Pitch1 (nm) | Material | Mounting | Remarks |
---|---|---|---|---|---|---|
AFM, SEM4, Auger, FIB | 70-1D (out of stock) and 70-1DUTC | parallel ridges | 70 | SiO2 on Si | unmounted, on steel disk or on an SEM stub (extra charge) | Use contact or tapping mode. Works well in SEM |
AFM, SEM4, Auger, STM3 | 150-2D and 150-2DUTC | Array of rounded bumps | 144 | Al on Si | use contact or tapping mode. Works well in SEM SEI and BEI modes | use contact or tapping mode. Works well in SEM SEI and BEI modes |
AFM,SEM2, TOF-SIMS, Auger2, Surface Potential, other material contrast techniques. NSOM5. | 150-1D and 145TC | Parallel ridges | 144 | Al lines on Glass | unmounted or on steel disk | use contact or tapping mode. |
AFM, SEM4, TOF-SIMS, Auger, Surface Potential, other material contrast techniques. | 301BE and 292UTC | parallel ridges | 292 | Ti lines on Si | unmounted, on steel disk, or on an SEM stub (extra charge) | use contact or tapping mode. Works well in SEM SEI and BEI modes |
AFM, SEM | 300-1D | Parallel ridges | 288 | W-coated Photoresist on Si | 15 mm steel disk | use contact or TappingMode. |
AFM, SEM | 300-2D | Array of Posts | 297 | Al bumps on Si | 15 mm steel disk | use contact or TappingMode |
AFM, SEM | 700-1D | Parallel ridges | 700 | W-coated Photoresist on Si | 15 mm steel disk | use contact or TappingMode |
AFM, SEM | 700-2D | Array of Posts | 700 | W-coated Photoresist on Si | 15 mm steel disk | use TappingMode |
AFM, SEM4, STM, Extreme Environments | 750-HD | Array of flat bumps | 750 (X), Z (100) | Ni | unmounted | High Durability: TappingMode, Contact Mode, STM, Liquid, High Temperature |
AFM Phase Imaging | PT | random hard and soft domains as small as 10 nm | none | polymer | 15 mm steel disk | test resolution and build confidence in phase imaging |
AFM, Nanomechanics, Nanofluidics | 751-HD NanoChannel Array Substrate | array of ridges with occasional bulges ("stoppers") | n/a. Channel width about 370 nm, depth about 180 nm | Nickel | unmounted, see data sheet for details | Confine materials in channel. Use ridges as NanoAnvil in 3-point bend test. Priced for use as disposable substrate. Not intended as a calibrator. |
Specimen compatibility - AFM and STM Scanning Modes and Special Environments:
Specimen | TappingModeTM | Contact Mode | STM | SEM, Auger, and similar techniques4 | Liquid | High Temperature |
---|---|---|---|---|---|---|
70-1D, 70-1DUTC | Yes | Yes | No | Yes | Not yet tested | Not yet tested |
301BE, 292UTC | Yes | Yes | No | Yes | Not yet tested | Not yet tested |
150-2D, 150-2DUTC, | Yes | Yes | Yes | Yes | Not yet tested | Not yet tested |
300-2D, 302-edu | Yes | Yes | Yes | Yes | Not yet tested | Not yet Tested |
150-1D, 145TC | Yes | Yes | No | Yes | Not yet tested | Not yet tested |
300-1D, 700-1D | Yes | Yes | No | No | No | No |
700-2D | Yes | No | No | No | No | No |
750-HD | Yes | Yes | Yes | No | Yes | Yes |
751-HD | Yes | Yes | Yes | No | Yes | Yes |
PT | Yes | Yes | No | No | Yes | No |
Specimens can be gold coated by user for STM. Sorry, no warranty or refund after you modify the specimen.
Specimens available unmounted, mounted on steel disks, or mounted on SEM mounts.
What customers say about our Calibration and Test Specimens
“The Model 150-2D calibration specimen arrived promptly and has already helped us identify a problem with one of our AFMs.”
– A. J. Katan, University of Leiden, The Netherlands
1 A certificate accompanies each specimen giving the actual pitch value.
2 may require customer-deposited coating for SEM or Auger use
3 a conductive coating may be required for STM use.
4 Available unmounted or mounted (extra cost – please specify desired stub).
5. SNOM is Scanning Near-field Optical Microscopy, sometimes called NSOM (near-field scanning optical microscopy).