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ASM Calibrators Price List
Model | PRICE | ||
---|---|---|---|
145TC Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass. Substrate: Glass about 4x6 mm x 0.7mm thick. | |||
- | 145TC | Unmounted | $4,629 |
- | 145TC-AFM | Mounting: on steel disk for AFM | $4,931 |
- | 145TC-SEM | Mounting: on pin mount type “A” for SEM | $4,931 |
- | 145TC-SEMX | Mounting: on other type SEM mount, including user-supplied | $4,931 |
150-1D Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass. Substrate: Glass about 4x6 mm x 0.7mm thick. | |||
- | 150-1D | Unmounted | $835 |
- | 150-1D-AFM | Mounting: on steel disk for AFM | $986 |
- | 150-1D-SEM | Mounting: on pin mount type “A” for SEM | $986 |
- | 150-1D-SEMX | Mounting: on other type SEM mount, including user-supplied | $986 |
150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 150-2D | Unmounted | $1,442 |
- | 150-2D-AFM | Mounting: on steel disk for AFM | $1,593 |
- | 150-2D-SEM | Mounting: on pin mount type “A” for SEM | $1,593 |
- | 150-2D-SEMX | Mounting: on other type SEM mount, including user-supplied | $1,593 |
150-2D-Mini | Miniature version of Model 150-2D. Die size about 0.9x0.9 mm x 0.7mm thick. Sold unmounted only. Recommended for applications, such as high-speed AFM, where low mass and/or small size are advantageous. Unmounted | $779 | |
150-2DUTC Traceable Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 150-2DUTC | Unmounted | $8,272 |
- | 150-2DUTC-AFM | Mounting: on steel disk for AFM | $8,574 |
- | 150-2DUTC-SEM | Mounting: on pin mount type “A” for SEM | $8,574 |
- | 150-2DUTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $8,574 |
292UTC Universal Traceable Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual period), Ti on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 292UTC | Unmounted | $5,313 |
- | 292UTC-AFM | Mounting: on steel disk for AFM | $5,615 |
- | 292UTC-SEM | Mounting: on pin mount type “A” for SEM | $5,615 |
- | 292UTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $5,615 |
300-1D Calibration Specimen, 1-dimensional, 288 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 300-1D | Unmounted | $554 |
- | 300-1D-AFM | Mounting: on steel disk for AFM | $705 |
- | 300-1D-SEM | Mounting: on pin mount type “A” for SEM | $705 |
- | 300-1D-SEMX | Mounting: on other type SEM mount, including user-supplied | $705 |
300-2D Calibration specimen, 2-dimensional, 300 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 300-2D | Unmounted | $1,069 |
- | 300-2D-AFM | Mounting: on steel disk for AFM | $1,220 |
- | 300-2D-SEM | Mounting: on pin mount type “A” for SEM | $1,220 |
- | 300-2D-SEMX | Mounting: on other type SEM mount, including user-supplied | $1,220 |
300-2D-Mini | Miniature version of Model 300-2D. Die size about 0.9x0.9 mm x 0.7mm thick. Sold unmounted only. Recommended for applications, such as high-speed AFM, where low mass and/or small size are advantageous. Unmounted | $601 | |
301BE Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual pitch), Ti on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 301BE | Unmounted | $1,517 |
- | 301BE-AFM | Mounting: on steel disk for AFM | $1,668 |
- | 301BE-SEM | Mounting: on pin mount type “A” for SEM | $1,668 |
- | 301BE-SEMX | Mounting: on other type SEM mount, including user-supplied | $1,668 |
302-edu. Student grade Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 302-edu | Unmounted | $491 |
- | 302-edu-AFM | Mounting: on steel disk for AFM | $642 |
- | 302-edu-SEM | Mounting: on pin mount type “A” for SEM | $642 |
- | 302-edu-SEMX | Mounting: on other type SEM mount, including user-supplied | $642 |
70-1DUTC Traceable Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 70-1DUTC | Unmounted | $5,644 |
- | 70-1DUTC-AFM | Mounting: on steel disk for AFM | $5,946 |
- | 70-1DUTC-SEM | Mounting: on pin mount type “A” for SEM | $5,946 |
- | 70-1DUTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $5,946 |
700-1D Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 700-1D | Unmounted | $418 |
- | 700-1D-AFM | Mounting: on steel disk for AFM | $569 |
- | 700-1D-SEM | Mounting: on pin mount type “A” for SEM | $569 |
- | 700-1D-SEMX | Mounting: on other type SEM mount, including user-supplied | $569 |
700-1DUTC Universal Traceable Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to calibration certificate for actual period), W-coated photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 700-1DUTC | Unmounted | $4,528 |
- | 700-1DUTC-AFM | Mounting: on steel disk for AFM | $4,830 |
- | 700-1DUTC-SEM | Mounting: on pin mount type “A” for SEM | $4,830 |
- | 700-1DUTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $4,830 |
700-2D Calibration specimen, 2-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 700-2D | Unmounted | $835 |
- | 700-2D-AFM | Mounting: on steel disk for AFM | $986 |
- | 700-2D-SEM | Mounting: on pin mount type “A” for SEM | $986 |
- | 700-2D-SEMX | Mounting: on other type SEM mount, including user-supplied | $986 |
750-HD durable Calibration specimen, 1-Dimensional with 750 nm nominal period; 100 nm nominal height (refer to certificate for actual values), solid Ni. Specimen size about 6 x 4 mm x 0.3 mm thick. | |||
- | 750-HD | Unmounted | $380 |
- | 750-HD-AFM | Mounting: on steel disk for AFM | $531 |
- | 750-HD-SEM | Mounting: on pin mount type “A” for SEM | $531 |
- | 750-HD-SEMX | Mounting: on other type SEM mount, including user-supplied | $531 |
751-HD durable NanoChannel Array Substrate. Channel width about 370 nm, depth about 180 nm. Usable in AFM and STM (intended as consumable supply). Specimen size about 6 x 4 mm x 0.3 mm thick. | |||
- | 751-HD | Unmounted | $120 |
- | 751-HD-AFM | Mounting: on steel disk for AFM | $271 |
- | 751-HD-SEM | Mounting: on pin mount type “A” for SEM | $271 |
- | 751-HD-SEMX | Mounting: on other type SEM mount, including user-supplied | $271 |
PT - Phase Imaging Test Specimen. Mounting: on 12 or 15 mm diam. steel disk only. | $229 | ||
Measure die dimensions | $111 | ||
Small order fee | $32 |