Download our Calibrator Guide PDF.

70-1D/70-1DUTC

Notice:  The Model 70-1D is out of stock.  A limited number of 70-1DUTC remain.

  • Applications:  AFM, SEM, Auger, FIB
  • Pattern:  parallel ridges
  • Approximate Pitch1:  70 nm
  • Material:  SiOon Si
  • Mounting:  Unmounted, On 12 or 15 mm Steel Disk, or on SEM Stub (extra charge)
  • Remarks:  Use Contact or Tapping mode AFM.  Works well in SEM 

150-2D /150-2DUTC

3X3 um Tapping Mode AFM Image.
  • Applications:  AFM, SEM, Auger, STM
  • Pattern:  Array of rounded bumps
  • Approximate Pitch1:  144 nm
  • Material:  Alon Si
  • Mounting:  Unmounted, on 12 or 15 mm Steel Disk, or on SEM Stub (extra charge)
  • Remarks:  use contact or tapping mode.  Works well in SEM.

150-1D/145TC

2.5 um AFM Image
  • Applications:  AFM,SEM2, TOF-SIMS, Auger, Surface Potential, other material contrast techniques. NSOM’s Super Resolution Optical Microscopy
  • Pattern:  Parallel Ridges
  • Approximate Pitch1:  144 nm
  • Material:  Allines on Glass
  • Mounting:  Unmounted or on 12 or 15 mm steel disk
  • Remarks:  use contact or tapping mode..

750-HD 

4 um AFM image rendered in illumination/slope mode.
  • Applications:  AFM,SEM, STM
  • Pattern:  Array of flat bumps
  • Approximate Pitch1:  X 750, Z 100 nm
  • Material:  Ni
  • Mounting:  Unmounted
  • Remarks:  High Durability:  TappingMode, Contact Mode, STM, Liquid, High Temperature

301BE/292UTC

2.5 um AFM Scan
  • Applications:  AFM,SEM, TOF-SIMS, Auger, Surface Potential, other material contrast techniques.
  • Pattern:  Parallel Ridges
  • Approximate Pitch1:  292 nm
  • Material:  Ti lines on Si
  • Mounting:  unmounted, on steel disk, or on an SEM stub (extra charge)
  • Remarks:  use contact or tapping mode.  Works well in SEM SEI and BEI modes

700-1D/700-1DUTC

Details

  • Applications:  AFM, SEM
  • Pattern:  Parallel Ridges
  • Approximate Pitch1:  700 nm
  • Material:  W coated photoresist on Si.
  • Mounting:  12 or 15 mm steel disk
  • Remarks:  use contact or tapping mode.

Sample Dimension and Pattern Orientation.


Traceable Calibration is now available for the 70-1D, 301BE, 150-2D, and 150-1D specimens, as models 70-1DUTC, 292 UTC, 150-DUTC, and 145 TC.  This helps you achieve higher quality and meet ISO-9000 and 14000 requirements.

What does traceability mean?
The calibration certificate for ordinary specimens gives an average pitch value based on batch measurements.  In contrast, the certificate of traceable calibration reports the average pitch value and the uncertainty of single pitch values, based on individual measurements of the actual specimen and the measurements are traceable to the international meter.  Our traceability path for 70-1DUTC is via NIST.  Our traceability path for 150-2DUTC, 145TC, 292UTC, and 700-1DUTC is via PTB, the German counterpart of NIST.  This is equivalent to NIST traceability, based on a mutual recognition agreement for nanoscale measurements among NIST, PTB, and other leading national measurement labs.

Download our Calibrator Guide PDF.

Calibration Specimen Details

ApplicationProductPatternApprox.
Pitch1 (nm)
MaterialMountingRemarks
AFM, SEM4, Auger, FIB70-1D (out of stock) and 70-1DUTC parallel ridges70SiO2 on Siunmounted, on steel disk or on an SEM stub (extra charge)Use contact or tapping mode. Works well in SEM
AFM, SEM4, Auger, STM3150-2D and 150-2DUTC Array of rounded bumps 144 Al on Siuse contact or tapping mode. Works well in SEM SEI and BEI modesuse contact or tapping mode. Works well in SEM SEI and BEI modes
AFM,SEM2, TOF-SIMS, Auger2, Surface Potential, other material contrast techniques. NSOM5.150-1D and 145TC
Parallel ridges
144Al lines on Glassunmounted or on steel diskuse contact or tapping mode.
AFM, SEM4, TOF-SIMS, Auger, Surface Potential, other material contrast techniques.301BE and 292UTCparallel ridges292Ti lines on Siunmounted, on steel disk, or on an SEM stub (extra charge)use contact or tapping mode. Works well in SEM SEI and BEI modes
AFM, SEM300-1DParallel ridges288W-coated Photoresist on Si15 mm steel diskuse contact or TappingMode.
AFM, SEM300-2DArray of Posts297Al bumps on Si15 mm steel diskuse contact or TappingMode
AFM, SEM700-1DParallel ridges
700
W-coated Photoresist on Si15 mm steel diskuse contact or TappingMode
AFM, SEM
700-2D
Array of Posts700W-coated Photoresist on Si15 mm steel diskuse TappingMode
AFM, SEM4, STM, Extreme Environments750-HDArray of flat bumps750 (X), Z (100)
Ni

unmounted
High Durability: TappingMode, Contact Mode, STM, Liquid, High Temperature
AFM Phase ImagingPTrandom hard and soft domains as small as 10 nm nonepolymer
15 mm steel disk
test resolution and build confidence in phase imaging
AFM, Nanomechanics, Nanofluidics 751-HD NanoChannel Array Substratearray of ridges with occasional bulges ("stoppers")n/a. Channel width about 370 nm, depth about 180 nm Nickel unmounted, see data sheet for details Confine materials in channel. Use ridges as NanoAnvil in 3-point bend test.
Priced for use as disposable substrate. Not intended as a calibrator.

Specimen compatibility - AFM and STM Scanning Modes and Special Environments:

SpecimenTappingModeTMContact ModeSTMSEM, Auger, and similar techniques4LiquidHigh Temperature
70-1D, 70-1DUTCYesYesNoYesNot yet testedNot yet tested
301BE, 292UTCYesYesNoYesNot yet testedNot yet tested
150-2D, 150-2DUTC,YesYesYesYesNot yet testedNot yet tested
300-2D, 302-eduYesYesYesYesNot yet testedNot yet Tested
150-1D, 145TCYesYesNoYesNot yet testedNot yet tested
300-1D, 700-1DYesYesNoNoNoNo
700-2DYesNoNoNoNoNo
750-HDYesYesYesNoYesYes
751-HDYesYesYesNoYesYes
PTYesYesNoNoYesNo

Specimens can be gold coated by user for STM.  Sorry, no warranty or refund after you modify the specimen.

Specimens available unmounted, mounted on steel disks, or mounted on SEM mounts.

What customers say about our Calibration and Test Specimens

“The Model 150-2D calibration specimen arrived promptly and has already helped us identify a problem with one of our AFMs.” 
    – A. J. Katan, University of Leiden, The Netherlands


1 A certificate accompanies each specimen giving the actual pitch value. 

2 may require customer-deposited coating for SEM or Auger use

3 a conductive coating may be required for STM use.

4 Available unmounted or mounted (extra cost – please specify desired stub).

5. SNOM is Scanning Near-field Optical Microscopy, sometimes called NSOM (near-field scanning optical microscopy).