Atomic Force Microscopy (AFM) is an important analytical tool in science and industry. It’s one of the key metrology (measurement) tools used in Nanotechnology, in the semiconductor industry, in optical discs (CD, DVD, Blu-Ray, etc.), in magnetic media, and in many other fields. AFM is used to analyze surface finishes and roughness, material wear, corrosion, and other surface structures. It can be used to map material domains in polymers, crystal structures in metals, particle size and distribution, formed micro and nano-structures, structure and size of catalyst and other powders, fibers of all types, pharmaceutical materials, and many other things. We’ve analyzed everything from the microroughness of superpolished optics to atomic steps on semiconductor wafers, from DNA molecules to polymer blends used in food packaging, from the sharpness of razor blades to wear patterns on piston rings and the shape of liquid droplets, from the size of nanomedicines to the track pitch variation of Blu-Ray discs.
Any surface you can touch is a potential object for study
Techniques we have available include TappingMode height and phase imaging, Scanning Tunneling Microscopy (STM), Nano indenting and scratching, Electric and Magnetic Force Microscopy (EFM and MFM), Scanning Kelvin Probe Microscopy (Surface Potential), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other conductive AFM techniques.
Whether you need analysis, consultation or training to use your AFM equipment better, supplies and accessories, traceable calibration standards, NanoScope equipment or equipment repairs, contact us. We can help.