Current Prices

SPM, AFM, STM, and SEM Calibration Samples

(Nominal pitch values are approximate and for informational purposes only.  See calibration certificates provided with the specimens for more detailed information.)

ASM Calibrators Price List

ModelPRICE
145TC Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass. Substrate: Glass about 4x6 mm x 0.7mm thick.
-145TCUnmounted $4,629
-145TC-AFMMounting: on steel disk for AFM $4,931
-145TC-SEMMounting: on pin mount type “A” for SEM $4,931
-145TC-SEMXMounting: on other type SEM mount, including user-supplied $4,931
150-1D Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass. Substrate: Glass about 4x6 mm x 0.7mm thick.
-150-1D Unmounted $835
-150-1D-AFMMounting: on steel disk for AFM $986
-150-1D-SEMMounting: on pin mount type “A” for SEM $986
-150-1D-SEMXMounting: on other type SEM mount, including user-supplied $986
150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick.
-150-2DUnmounted $1,442
-150-2D-AFM Mounting: on steel disk for AFM $1,593
-150-2D-SEMMounting: on pin mount type “A” for SEM $1,593
-150-2D-SEMXMounting: on other type SEM mount, including user-supplied $1,593
150-2D-MiniMiniature version of Model 150-2D. Die size about 0.9x0.9 mm x 0.7mm thick. Sold unmounted only. Recommended for applications, such as high-speed AFM, where low mass and/or small size are advantageous. Unmounted $779
150-2DUTC Traceable Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick.
-150-2DUTCUnmounted $8,272
-150-2DUTC-AFMMounting: on steel disk for AFM $8,574
-150-2DUTC-SEMMounting: on pin mount type “A” for SEM $8,574
-150-2DUTC-SEMXMounting: on other type SEM mount, including user-supplied $8,574
292UTC Universal Traceable Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual period), Ti on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-292UTCUnmounted $5,313
-292UTC-AFMMounting: on steel disk for AFM $5,615
-292UTC-SEMMounting: on pin mount type “A” for SEM $5,615
-292UTC-SEMXMounting: on other type SEM mount, including user-supplied $5,615
300-1D Calibration Specimen, 1-dimensional, 288 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-300-1DUnmounted $554
-300-1D-AFMMounting: on steel disk for AFM $705
-300-1D-SEMMounting: on pin mount type “A” for SEM $705
-300-1D-SEMXMounting: on other type SEM mount, including user-supplied $705
300-2D Calibration specimen, 2-dimensional, 300 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick.
-300-2DUnmounted $1,069
-300-2D-AFMMounting: on steel disk for AFM $1,220
-300-2D-SEMMounting: on pin mount type “A” for SEM $1,220
-300-2D-SEMXMounting: on other type SEM mount, including user-supplied $1,220
300-2D-MiniMiniature version of Model 300-2D. Die size about 0.9x0.9 mm x 0.7mm thick. Sold unmounted only. Recommended for applications, such as high-speed AFM, where low mass and/or small size are advantageous. Unmounted $601
301BE Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual pitch), Ti on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-301BEUnmounted $1,517
-301BE-AFMMounting: on steel disk for AFM $1,668
-301BE-SEMMounting: on pin mount type “A” for SEM $1,668
-301BE-SEMXMounting: on other type SEM mount, including user-supplied $1,668
302-edu. Student grade Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick.
-302-eduUnmounted $491
-302-edu-AFMMounting: on steel disk for AFM $642
-302-edu-SEMMounting: on pin mount type “A” for SEM $642
-302-edu-SEMXMounting: on other type SEM mount, including user-supplied $642
70-1DUTC Traceable Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-70-1DUTCUnmounted $5,644
-70-1DUTC-AFMMounting: on steel disk for AFM $5,946
-70-1DUTC-SEMMounting: on pin mount type “A” for SEM $5,946
-70-1DUTC-SEMXMounting: on other type SEM mount, including user-supplied $5,946
700-1D Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-700-1DUnmounted $418
-700-1D-AFMMounting: on steel disk for AFM $569
-700-1D-SEMMounting: on pin mount type “A” for SEM $569
-700-1D-SEMXMounting: on other type SEM mount, including user-supplied $569
700-1DUTC Universal Traceable Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to calibration certificate for actual period), W-coated photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-700-1DUTCUnmounted $4,528
-700-1DUTC-AFMMounting: on steel disk for AFM $4,830
-700-1DUTC-SEMMounting: on pin mount type “A” for SEM $4,830
-700-1DUTC-SEMXMounting: on other type SEM mount, including user-supplied $4,830
700-2D Calibration specimen, 2-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick.
-700-2DUnmounted $835
-700-2D-AFMMounting: on steel disk for AFM $986
-700-2D-SEMMounting: on pin mount type “A” for SEM $986
-700-2D-SEMXMounting: on other type SEM mount, including user-supplied $986
750-HD durable Calibration specimen, 1-Dimensional with 750 nm nominal period; 100 nm nominal height (refer to certificate for actual values), solid Ni. Specimen size about 6 x 4 mm x 0.3 mm thick.
-750-HD Unmounted $380
-750-HD-AFMMounting: on steel disk for AFM $531
-750-HD-SEMMounting: on pin mount type “A” for SEM $531
-750-HD-SEMXMounting: on other type SEM mount, including user-supplied $531
751-HD durable NanoChannel Array Substrate. Channel width about 370 nm, depth about 180 nm. Usable in AFM and STM (intended as consumable supply). Specimen size about 6 x 4 mm x 0.3 mm thick.
-751-HDUnmounted $120
-751-HD-AFMMounting: on steel disk for AFM $271
-751-HD-SEMMounting: on pin mount type “A” for SEM $271
-751-HD-SEMXMounting: on other type SEM mount, including user-supplied $271
PT - Phase Imaging Test Specimen. Mounting: on 12 or 15 mm diam. steel disk only.$229
Measure die dimensions$111
Small order fee$32

Certification Service

ItemPrice
Cert-1 Calibration of One dimensional pitch specimen, traceable to National Laboratory..$3795
Cert-2 Calibration of Two dimensional specimen, traceable to National Laboratory..$6829
Recert-1 Re-Calibration of One dimensional pitch specimen, traceable to National Laboratory$3036
ReCert-2 Re-Calibration of Two dimensional pitch specimen, traceable to National Laboratory$5464
Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price. 

* See Calibration certificate for precise value

Probes

Silicon Nitride AFM Probes for contact mode or tapping in liquid

ItemPrice
SiN AFM probes, oxide-sharpened (box of 24 pcs), grade 1$340
SiN AFM probes, oxide-sharpened, Grade 2 (price is per-probe) Minimum order sizes apply$7.10
SiN AFM probes, standard (box of 24 pcs), grade 1$192
SiN AFM probes, standard, Grade 2 (price is per-probe) Minimum order sizes apply$4
SiN AFM probes, Cr-coated, grade 1, box of 24 pieces (if available)$288
SiN AFM probes, Cr-coated, grade 2, box of 24 pieces (if available)$144
  
Notes: 
Grade 1 probes have 4 tips per probe. 
Grade 2 probes have 1-3 tips per probe. 
Practice grade probes have 1-4 tips per probe and some of the tips have been used. 

Silicon AFM probes for Tapping Mode in air

Si AFM probes, standard type, (for an order of 5-20 pcs) (per probe)40
Si AFM probes, standard type, for each piece over 20 pcs in a single order           (per probe)$24
Example:         30 pcs. costs $1040 (20*40 + 10*24) 
Si AFM probes, practice grade (for an order < 90 pcs)$11
Si AFM probes, practice grade (for an order > 90 pcs)$8
Note: Our AFM Probes are similar to those described at www.brukerafmprobes.com

Sample Holders for Dimension AFM

ItemPrice
MV-1 Mini-viseask
SH-1 Stub holder (SEM and BEEM)ask
TT-1 Tilt Tableask

Ordering Information

Minimum Order Requirements

$200 Domestic
$300 for export
$30 small order fee applies when the merchandise value is less than the minimum.

Terms

We strongly encourage the use of credit cards for purchases under $1000.  We accept MaseterCard (Eurocard), Visa, Discover (Novus), and American Express.

For orders over $1000 we accept purchase orders wtih Net 30 days on approved credit.
F.O.B. our plant, Indianapolis.

All prices are in US Dollars.

Warranty

Supplies are sold with a 30-day money-back guarantee.  An additional parts and labor warranty may apply on equipment, if stated on our quotation or invoice.

If a warranty is stated on our invoice, that warranty will apply.

No other warranty applies.

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