SPM, AFM, STM, and SEM Calibration Samples
(Nominal pitch values are approximate and for informational purposes only. See calibration certificates provided with the specimens for more detailed information.)
ASM Calibrators Price List
Model | PRICE | ||
---|---|---|---|
145TC Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass. Substrate: Glass about 4x6 mm x 0.7mm thick. | |||
- | 145TC | Unmounted | $4,629 |
- | 145TC-AFM | Mounting: on steel disk for AFM | $4,931 |
- | 145TC-SEM | Mounting: on pin mount type “A” for SEM | $4,931 |
- | 145TC-SEMX | Mounting: on other type SEM mount, including user-supplied | $4,931 |
150-1D Calibration Specimen, 1-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on glass. Substrate: Glass about 4x6 mm x 0.7mm thick. | |||
- | 150-1D | Unmounted | $835 |
- | 150-1D-AFM | Mounting: on steel disk for AFM | $986 |
- | 150-1D-SEM | Mounting: on pin mount type “A” for SEM | $986 |
- | 150-1D-SEMX | Mounting: on other type SEM mount, including user-supplied | $986 |
150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 150-2D | Unmounted | $1,442 |
- | 150-2D-AFM | Mounting: on steel disk for AFM | $1,593 |
- | 150-2D-SEM | Mounting: on pin mount type “A” for SEM | $1,593 |
- | 150-2D-SEMX | Mounting: on other type SEM mount, including user-supplied | $1,593 |
150-2D-Mini | Miniature version of Model 150-2D. Die size about 0.9x0.9 mm x 0.7mm thick. Sold unmounted only. Recommended for applications, such as high-speed AFM, where low mass and/or small size are advantageous. Unmounted | $779 | |
150-2DUTC Traceable Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 150-2DUTC | Unmounted | $8,272 |
- | 150-2DUTC-AFM | Mounting: on steel disk for AFM | $8,574 |
- | 150-2DUTC-SEM | Mounting: on pin mount type “A” for SEM | $8,574 |
- | 150-2DUTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $8,574 |
292UTC Universal Traceable Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual period), Ti on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 292UTC | Unmounted | $5,313 |
- | 292UTC-AFM | Mounting: on steel disk for AFM | $5,615 |
- | 292UTC-SEM | Mounting: on pin mount type “A” for SEM | $5,615 |
- | 292UTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $5,615 |
300-1D Calibration Specimen, 1-dimensional, 288 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 300-1D | Unmounted | $554 |
- | 300-1D-AFM | Mounting: on steel disk for AFM | $705 |
- | 300-1D-SEM | Mounting: on pin mount type “A” for SEM | $705 |
- | 300-1D-SEMX | Mounting: on other type SEM mount, including user-supplied | $705 |
300-2D Calibration specimen, 2-dimensional, 300 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 300-2D | Unmounted | $1,069 |
- | 300-2D-AFM | Mounting: on steel disk for AFM | $1,220 |
- | 300-2D-SEM | Mounting: on pin mount type “A” for SEM | $1,220 |
- | 300-2D-SEMX | Mounting: on other type SEM mount, including user-supplied | $1,220 |
300-2D-Mini | Miniature version of Model 300-2D. Die size about 0.9x0.9 mm x 0.7mm thick. Sold unmounted only. Recommended for applications, such as high-speed AFM, where low mass and/or small size are advantageous. Unmounted | $601 | |
301BE Calibration Specimen, 1-dimensional, 292 nm nominal period (refer to calibration certificate for actual pitch), Ti on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 301BE | Unmounted | $1,517 |
- | 301BE-AFM | Mounting: on steel disk for AFM | $1,668 |
- | 301BE-SEM | Mounting: on pin mount type “A” for SEM | $1,668 |
- | 301BE-SEMX | Mounting: on other type SEM mount, including user-supplied | $1,668 |
302-edu. Student grade Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si. Substrate: Silicon about 4x3 mm x 0.7mm thick. | |||
- | 302-edu | Unmounted | $491 |
- | 302-edu-AFM | Mounting: on steel disk for AFM | $642 |
- | 302-edu-SEM | Mounting: on pin mount type “A” for SEM | $642 |
- | 302-edu-SEMX | Mounting: on other type SEM mount, including user-supplied | $642 |
70-1DUTC Traceable Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 70-1DUTC | Unmounted | $5,644 |
- | 70-1DUTC-AFM | Mounting: on steel disk for AFM | $5,946 |
- | 70-1DUTC-SEM | Mounting: on pin mount type “A” for SEM | $5,946 |
- | 70-1DUTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $5,946 |
700-1D Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 700-1D | Unmounted | $418 |
- | 700-1D-AFM | Mounting: on steel disk for AFM | $569 |
- | 700-1D-SEM | Mounting: on pin mount type “A” for SEM | $569 |
- | 700-1D-SEMX | Mounting: on other type SEM mount, including user-supplied | $569 |
700-1DUTC Universal Traceable Calibration Specimen, 1-dimensional, 700 nm nominal period (refer to calibration certificate for actual period), W-coated photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 700-1DUTC | Unmounted | $4,528 |
- | 700-1DUTC-AFM | Mounting: on steel disk for AFM | $4,830 |
- | 700-1DUTC-SEM | Mounting: on pin mount type “A” for SEM | $4,830 |
- | 700-1DUTC-SEMX | Mounting: on other type SEM mount, including user-supplied | $4,830 |
700-2D Calibration specimen, 2-dimensional, 700 nm nominal period (refer to certificate for actual period), W-coated Photoresist on Si. Substrate: Silicon about 4x3 mm x 0.5 mm thick. | |||
- | 700-2D | Unmounted | $835 |
- | 700-2D-AFM | Mounting: on steel disk for AFM | $986 |
- | 700-2D-SEM | Mounting: on pin mount type “A” for SEM | $986 |
- | 700-2D-SEMX | Mounting: on other type SEM mount, including user-supplied | $986 |
750-HD durable Calibration specimen, 1-Dimensional with 750 nm nominal period; 100 nm nominal height (refer to certificate for actual values), solid Ni. Specimen size about 6 x 4 mm x 0.3 mm thick. | |||
- | 750-HD | Unmounted | $380 |
- | 750-HD-AFM | Mounting: on steel disk for AFM | $531 |
- | 750-HD-SEM | Mounting: on pin mount type “A” for SEM | $531 |
- | 750-HD-SEMX | Mounting: on other type SEM mount, including user-supplied | $531 |
751-HD durable NanoChannel Array Substrate. Channel width about 370 nm, depth about 180 nm. Usable in AFM and STM (intended as consumable supply). Specimen size about 6 x 4 mm x 0.3 mm thick. | |||
- | 751-HD | Unmounted | $120 |
- | 751-HD-AFM | Mounting: on steel disk for AFM | $271 |
- | 751-HD-SEM | Mounting: on pin mount type “A” for SEM | $271 |
- | 751-HD-SEMX | Mounting: on other type SEM mount, including user-supplied | $271 |
PT - Phase Imaging Test Specimen. Mounting: on 12 or 15 mm diam. steel disk only. | $229 | ||
Measure die dimensions | $111 | ||
Small order fee | $32 |
Certification Service
Item | Price |
Cert-1 Calibration of One dimensional pitch specimen, traceable to National Laboratory.. | $3795 |
Cert-2 Calibration of Two dimensional specimen, traceable to National Laboratory.. | $6829 |
Recert-1 Re-Calibration of One dimensional pitch specimen, traceable to National Laboratory | $3036 |
ReCert-2 Re-Calibration of Two dimensional pitch specimen, traceable to National Laboratory | $5464 |
Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price. |
* See Calibration certificate for precise value
Probes
Silicon Nitride AFM Probes for contact mode or tapping in liquid
Item | Price |
SiN AFM probes, oxide-sharpened (box of 24 pcs), grade 1 | $340 |
SiN AFM probes, oxide-sharpened, Grade 2 (price is per-probe) Minimum order sizes apply | $7.10 |
SiN AFM probes, standard (box of 24 pcs), grade 1 | $192 |
SiN AFM probes, standard, Grade 2 (price is per-probe) Minimum order sizes apply | $4 |
SiN AFM probes, Cr-coated, grade 1, box of 24 pieces (if available) | $288 |
SiN AFM probes, Cr-coated, grade 2, box of 24 pieces (if available) | $144 |
Notes: | |
Grade 1 probes have 4 tips per probe. | |
Grade 2 probes have 1-3 tips per probe. | |
Practice grade probes have 1-4 tips per probe and some of the tips have been used. |
Silicon AFM probes for Tapping Mode in air
Si AFM probes, standard type, (for an order of 5-20 pcs) (per probe) | 40 |
Si AFM probes, standard type, for each piece over 20 pcs in a single order (per probe) | $24 |
Example: 30 pcs. costs $1040 (20*40 + 10*24) | |
Si AFM probes, practice grade (for an order < 90 pcs) | $11 |
Si AFM probes, practice grade (for an order > 90 pcs) | $8 |
Note: Our AFM Probes are similar to those described at www.brukerafmprobes.com |
Sample Holders for Dimension AFM
Item | Price |
MV-1 Mini-vise | ask |
SH-1 Stub holder (SEM and BEEM) | ask |
TT-1 Tilt Table | ask |
Ordering Information
Minimum Order Requirements
$200 Domestic
$300 for export
$30 small order fee applies when the merchandise value is less than the minimum.
Terms
We strongly encourage the use of credit cards for purchases under $1000. We accept MaseterCard (Eurocard), Visa, Discover (Novus), and American Express.
For orders over $1000 we accept purchase orders wtih Net 30 days on approved credit.
F.O.B. our plant, Indianapolis.
All prices are in US Dollars.
Warranty
Supplies are sold with a 30-day money-back guarantee. An additional parts and labor warranty may apply on equipment, if stated on our quotation or invoice.
If a warranty is stated on our invoice, that warranty will apply.
No other warranty applies.