Advanced Surface Microscopy, Inc is your source for all your Atomic Force Microscopy needs: Analytical services, repair, equipment, and supplies. Our products and services include:
Our experienced technicians can make a wide variety of repairs to NanoScope AFM systems including Automated AFMs. We have an extensive supply of replacement parts, including for systems no longer supported by the manufacturer. In addition we can provide new AFM control PCs.
We buy and sell used NanoScope brand AFM systems including Dimension, Multimode, STM, Automated AFM,and small sample AFM. All systems are refurbished and thoroughly tested before shipment and are covered by our standard warranty.
We offer our own services as experts in the field to analyze your samples in our in-house AFMs. We can apply our extensive range of analytical techniques to solve problems in understanding your samples, how their surface structure affects their function, to help you solve problems, shorten development times, and improve quality. We’ve worked with many industries and helped many people and businesses. We can help you too.
We provide supplies for use with your own AFM systems. This includes a wide variety of calibration references and standards with standards traceable to the International Meter. We provide a variety of different types of AFM probes. We also provide our own DiscTrack Plus Media Measurement System, originally developed for the optical disk industry, but also valuable wherever the size, shape, and spacing of grids and arrays of microscopic structures is important.
We are experts in the field of Atomic Force Microscopy. Want to get the best out of your system? We can help. Our experts can answer questions and provide training in NanoScope operation and understanding of NanoScope images and the variety of imaging modes available. This includes providing expert testimony in legal cases.
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Advanced Surface Microscopy, Inc.: Calibrator Pro, DiscTrack, DiscTrack Plus
and MagneTrack are trademarks.
Bruker-Nano/Veeco Metrology/Digital Instruments, Inc.: NanoScope and NanoProbe are
TappingMode, Dimension, TrakScan, MultiMode, and Vx Atomic Force Profiler are trademarks.
Other trademarks belong to their respective owners.
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Advanced Surface Microscopy, Inc. All rights reserved. No
images/information on these pages may be reproduced without express written
consent of ASM.